Mobility and Wearables Sensor and Display Solutions
Smart Multi-Bin Sorting
Mi Series
Wafer to Wafer Platform
Design to enable Multiple Bin Sorting - up to 10 bins!
Multiple Output Cassettes format to cater for multiple bin sorting efficiency
6S Advanced Sensor and Display level AOI available!
Industrial Automation ready - incorporating auto wafer cassette handling
Thin die capability
Class 100
ALS/ToF Test Handler
Si Series
Design to enable Sensor Testing with external stimuli
Multiple types of stimulus test (e.g. white light, proximity, cross-talk) available at one go, with one pick
and place to improve testing reliability & capability and improve output efficiency
Multi-test configuration available
High UPH
Tray input - protect sensor. Bowl feed input as option
Tape and reel output, with reject bin and tray
6 Sides inspection available with Sensor inspection as option