Automotive and Renewable Energy Solutions

Turret Based Known Good Die (KGD) Test Handler For Si Device, Complete with Laser Marking & AOI

Si30 Series

Market leading UPH
Equipped with parallel and serial testing solutions
Configured with test module XY compensation and real-time force control
Scratch-free aligner system on die back metalization
Testing and marking capabilities for small die size
Dynamic Laser Marking solution
Equipped with Advanced Automatic Optical Inspection (AOI)
Standard configuration with rework module

si30-series

si10w-plus

Turret Based Known Good Die (KGD) High & Room Temperature Test Handler For SiC Device, Complete with AOI

Si10w Plus

Market leading UPH
Supports 2x High Temperature & 2x Room Temperature Test Sites
Equipped with Advanced Automatic Optical Inspection (AOI)
Scratch-free aligner system on die back metalization
Quick and convenient socket replacement solution
Configured with test module XY compensation and real-time force control.
Fully vision guided alignment
Tester Solutions Available with Proven Short Circuit Test Capability – Prevent Die Damage!

Power Module Test Handler

Si Series

Tube input and output. Tray format available
Suitable for High Voltage / High Current application
High Temperature Testing Available
Incorporate Laser Marking and 2DID platform
AOI Available
Complete solutions with Tester available

hpc3

hpc2

Smart Multiple Bin Sorter

Mi Series

For SiC post KGD Multiple Bin Sorting
Market Leading UPH
Wafer Input to Multiple Tape and Reel
4 to 8 Tape & Reel available!
Advanced AOI incorporated
Detaper available to TnR or Wafer!